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Breakdown Characteristics of Kilo-Voltage Drain Offset Corbino Thin Film Transistor and Carrier Conduction Model

Jiaquan Kong,Chuan Liu,Hai Ou,Juncong She,Shaozhi Deng,Jun Chen

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

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Key words
Breakdown,Corbino,drain offset,high-voltage thin film transistors (HVTFTs),model
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