Reliable Methodology to FPGA Design Verification and Noise Analysis for Digital Lock-In Amplifiers
IEEE Embedded Systems Letters（2024）
Key words
Clocks,Field programmable gate arrays,Noise,Frequency measurement,IIR filters,Task analysis,Phase locked loops,Additive white Gaussian noise (AWGN),digital lock-in amplifiers (DLIAs),field-programmable gate array (FPGA),phase sensitive detector (PSD),spurious-free dynamic range (SFDR)
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