Yield Maximization of Flip-Flop Circuits Based on Deep Neural Network and Polyhedral Estimation of Nonlinear Constraints
IEEE ACCESS（2024）
Key words
Circuits,Flip-flops,Mathematical models,Integrated circuit modeling,Solid modeling,Measurement,Transistors,Design automation,Artificial neural networks,Nanometers,Circuit stability,Statistical analysis,Computer-aided design (CAD),circuit yield maximization,circuit simulation,deep neural network (DNN),flip-flop circuits,gate sizing,nanometer regime technologies,process variations,statistical design
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