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TXL-Fuzz: A Long Attention Mechanism-Based Fuzz Testing Model for Industrial IoT Protocols

Liangyin Chen, Yihan Wang,Xuanyi Xiang, Dian Jin,Yi Ren, Yunhai Zhang,Zhiwen Pan,Yanru Chen

IEEE INTERNET OF THINGS JOURNAL(2024)

Cited 1|Views8
Key words
Protocols,Fuzzing,Industrial Internet of Things,Transformers,Security,Task analysis,Data models,Fuzz testing,industrial control systems (ICSs),Industrial Internet of Things (IIoT) protocols,transformer-XL
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