FaultArm: Detecting Fault Injection Vulnerabilities in Arm Assembly

Prateek Kharangate, Guillermo Rached, Harris Musungu,Nan Niu,Boyang Wang

IEEE NATIONAL AEROSPACE AND ELECTRONICS CONFERENCE, NAECON 2024（2024）

Cited 0|Views6

Key words

Arm Assembly,Source Code,Automatic Detection,Electromagnetic Radiation,Program Execution,True Positive,Precision And Recall,Tokenized,Return Value,Boolean Variable,Parse Tree,Patterns Of Vulnerability,Higher Levels Of Optimism,Hamming Weight,Multiple Bits

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