A new experimental method for leakage current (conduction current) measurements in dielectrics, based on an analysis of the dynamics of temperature changes of the sample under the action of an electric field is proposed. A new non-contact photodiode IR-temperature sensor carries out high accuracy and high speed monitoring of the sample temperature response. The capabilities of the method are demonstrated on samples of 0.65 PbFe2/3W1/3O3-0.35 PbTiO3 (PFW-PT) ceramic, for which the experimental dependence of conductivity was obtained in a wide temperature range from 20 to 110 ° C.
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