We report on a method for determining the stress near the surface of a crystal that is partly transparent. A pump light pulse is applied to the sample to set up a stress near to the sample surface. This stress relaxes and launches a strain pulse into the sample. The propagation of this strain pulse can be monitored by means of a time-delayed optical probe pulse. The reflectivity of this probe light pulse contains a component which varies periodically with the time delay. We show how the period of this component can be precisely extracted from the data, how the period can be used to determine the stress in the sample, and the sensitivity of the technique for stress measurements.
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