Diffraction Pattern-Analysis For Automatic Defect Classification In Manufactured Electronic Assemblies

A technique for the quality assessment of fine-pitch electronic components is described. A system for the capture of Fraunhofer diffraction patterns reflected from the component is presented. The processing of the image to enable classification by a neural network is discussed. Simulation results are presented, showing the feasibility of the technique.© (1994) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.