Институт физики полупроводников им. А.В. Ржанова Сибирского отделения Российской академии наук
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摘要
A parametric model describing the spectra of the optical constants Hg1-xCdxTe n( lam) and k(lam) for x values in the range from 0.2 to 0.4 is presented. The Model is based on empirical data measured in situ during epitaxial growth of the compound layers. Variants of using the obtained model for determining the composition of MCT in situ in real time are considered. A method for determining the composition based on spectral ellipsometric measurements is proposed, which provides an accuracy no worse than (del)x=±0.0035.