A high resolution (ΔE < 100 meV) single shot spectrometer for the soft X-ray at SwissFEL is reported. Use of this high fidelity single shot data to develop new modes of operations of operation is described.
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electron volt energy 100.0 meV,FEL characterisation,high fidelity single shot data,high resolution soft X-ray spectrometer,ΔE <,100 meV
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