The advent of nanodielectrics, nanocomposite materials based on a polymeric matrix, and materials with physical properties ruled by interfacial effects in general demands techniques to characterize functional properties on a local scale with high spatial resolution. Scanning probe microscopies (SPMs), in their electrical modes, have emerged as indispensable tools to access physical quantities such as dielectric constant, surface potential, and static charge, with nanometer-scale lateral resolution and with surface selectivity, being influenced mainly by the outermost layer of the specimen. In this tribute, the development of various SPM electrical modes is illustrated, focusing on the measurement of dielectric permittivity and its spectroscopic extension to access the local, frequency-dependent dielectric function (local dielectric spectroscopy [LDS]). The application to nanostructured polymers in the form of ultrathin films, nanometer-scale-separated blends, and self-assembled block copolymer structures is described. LDS appears to be a promising technique for characterizing the electric properties of polymers and their composites as well as other glass formers and nanostructured systems.
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