关键词
delays,digital integrated circuits,integrated circuit modelling,BME,CellTherm application,Dept. of Electron Devices,Hungary,arbitrary fine granularity,arbitrary temperatures,characterization corner,classic SDF delay model,delay model temperature-aware timing simulation,delay-temperature functions,digital integrated circuits,exact delay value,high-resolution temperature dependent delay model,input-output path,linear interpolation,logi-thermal acceleration technique,logi-thermal simulation,precise delay value,process variation,propagation delay value,standard cell propagation delay,standard delay format,supply voltage,temperature characterization corner,temperature value,temperature-dependent detailed model,timing temperature dependence