Overthelast years, there isanincreasing needto knowandcharacterize thenonlinear behaviour ofmosthigh frequency semiconductor devices. Forthat, a newandoriginal automatic active Load-Pull system based onaLarge Signal network Analyzer ispresented whichallows tocarry outanaccurate non linear characterization withveryhighloadreflection coefficient (morethan0.96) undermicrowaves probes. After describing the setup andthecalibration procedure, adedicated study hasbeen performed inorder tovalidate theactive load-pull system andto knowandevaluate thegoodaccuracy ofnonlinear measurements. Atnonlinear modelofAlGaN/GaNHEMT device hasbeen established inorder tocompare measurements andsimulations.