Optimizing Workflows in Correlative Light and Electron Microscopy

Journal Article Optimizing Workflows in Correlative Light and Electron Microscopy Get access Kirk Czymmek, Kirk Czymmek Carl Zeiss Microcopy, LLC, One Zeiss Drive, Thornwood, NY 10594, USA Search for other works by this author on: Oxford Academic Google Scholar Jeff Caplan, Jeff Caplan 15 Innovation Way, Delaware Biotechnology Institute, University of Delaware, Newark DE 19711, USA Search for other works by this author on: Oxford Academic Google Scholar Cherish Warner, Cherish Warner 15 Innovation Way, Delaware Biotechnology Institute, Department of Plant and Soil Sciences, University of Delaware, Newark DE 19711, USA Search for other works by this author on: Oxford Academic Google Scholar Janine Sherrier, Janine Sherrier 15 Innovation Way, Delaware Biotechnology Institute, Department of Plant and Soil Sciences, University of Delaware, Newark DE 19711, USA Search for other works by this author on: Oxford Academic Google Scholar Alexandra Elli Alexandra Elli Carl Zeiss Microscopy, Carl-Zeiss-Strasse 22, 73447 Oberkochen, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1377–1378, https://doi.org/10.1017/S1431927615007679 Published: 23 September 2015