Reconstructing images using Computed Tomography (CT) in an industrial context leads to specific challenges that differ from those encountered in other areas, such as clinical CT. Indeed, non-destructive testing with industrial CT will often involve scanning multiple similar objects while maintaining high throughput, requiring short scanning times, which is not a relevant concern in clinical CT. Under-sampling the tomographic data (sinograms) is a natural way to reduce the scanning time at the cost of image quality since the latter depends on the number of measurements. In such a scenario, post-processing techniques are required to compensate for the image artifacts induced by the sinogram sparsity. We introduce the Self-supervised Denoiser Framework (SDF), a self-supervised training method that leverages pre-training on highly sampled sinogram data to enhance the quality of images reconstructed from undersampled sinogram data. The main contribution of SDF is that it proposes to train an image denoiser in the sinogram space by setting the learning task as the prediction of one sinogram subset from another. As such, it does not require ground-truth image data, leverages the abundant data modality in CT, the sinogram, and can drastically enhance the quality of images reconstructed from a fraction of the measurements. We demonstrate that SDF produces better image quality, in terms of peak signal-to-noise ratio, than other analytical and self-supervised frameworks in both 2D fan-beam or 3D cone-beam CT settings. Moreover, we show that the enhancement provided by SDF carries over when fine-tuning the image denoiser on a few examples, making it a suitable pre-training technique in a context where there is little high-quality image data. Our results are established on experimental datasets, making SDF a strong candidate for being the building block of foundational image-enhancement models in CT.
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