Serial Data Acquisition for GEM-2D Detector

Piotr Kolasinski,Krzysztof T. Pozniak,Tomasz Czarski,Maciej Linczuk,Adrian Byszuk,Maryna Chernyshova,Bartlomiej Juszczyk,Grzegorz Kasprowicz,Andrzej Wojenski,Wojciech Zabolotny,Pawel Zienkiewicz,Didier Mazon,Philippe Malard,Albrecht Herrmann,Didier Vezinet

Proceedings of SPIE--the International Society for Optical Engineering（2014）

Inst Elect Syst

被引用34|浏览15

摘要

This article debates about data fast acquisition and histogramming method for the X-ray GEM detector. The whole process of histogramming is performed by FPGA chips (Spartan-6 series from Xilinx). The results of the histogramming process are stored in an internal FPGA memory and then sent to PC. In PC data is merged and processed by MATLAB. The structure of firmware functionality implemented in the FPGAs is described. Examples of test measurements and results are presented.

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关键词

plasma diagnostics,GEM detector,FPGA,charge identification,data processing,fast histogramming,VHDL,Xilinx

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