学术搜索
科研智能体
- Research Labs
- AI 阅读
- AI 文库
- AMiner 沉思
- AMiner 亮点
学术资源
- AI2000
- 期刊/会议
- 学者库
- 学术API
- 溯源树
- 数据集
知识沉淀
- 学术空间

订阅小程序

旧版功能

立即登录

学术搜索
科研智能体
- Research Labs
- AI 阅读
- AI 文库
- AMiner 沉思
- AMiner 亮点
学术资源
- AI2000
- 期刊/会议
- 学者库
- 学术API
- 溯源树
- 数据集
知识沉淀
- 学术空间

订阅小程序

旧版功能

立即登录

Si Nanocrystal Split Gate Technology Optimization for High Performance and Reliable Embedded Microcontroller Applications | AMiner

Si Nanocrystal Split Gate Technology Optimization for High Performance and Reliable Embedded Microcontroller Applications

Sung-Taeg Kang,Jane Yater,CheongMin Hong,James Shen,Nicole Ellis,Matthew Herrick,Horacio Gasquet,Wendy Malloch,Gowrishankar Chindalore

2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design（2008）

Freescale Semicond Inc

被引用9|浏览12

摘要

In this paper, the authors present the performance characteristics of such a silicon nanocrystal split gate bitcell and report an optimal bitcell process and integration scheme for memory arrays.

查看译文

关键词

elemental semiconductors,embedded systems,microcontrollers,nanostructured materials,semiconductor storage,silicon,Si,Si nanocrystal split gate technology optimization,embedded microcontroller,memory arrays,optimal bitcell process,silicon nanocrystal split gate bitcell

PDF