1. A multi-chip package type semiconductor device, comprising: an insulating substrate having thereon a first conductive pattern and a second conductive pattern; a first semiconductor chip having a plurality of first internal circuits on the insulating substrate, the first semiconductor chip having a plurality of first terminal pads, each of which is connected to one of the first internal circuits and a plurality of conductive relay pads, each of which is isolated from the first terminal pads, and each of the conductive relay pads including a first area and a second area; which is different from the first area, wherein each first terminal pad and each conductive relay pad are alternatively aligned; a second semiconductor chip on the first semiconductor chip, the second semiconductor chip being smaller than the first semiconductor chip, and having a second internal circuit and having a second terminal pad connecting to the second internal circuit; a plurality of first metal bumps, each of which is formed on one of the conductive relay pads in the first area; a second metal bump formed on the second terminal pad; a first bonding wire, wherein one end thereof is formed on one of the first terminal pads and the other end is formed on the first conductive pattern; a second bonding wire, wherein one end thereof is formed on the second conductive pattern and the other end is formed at the top of the first metal bump on one of the conductive relay pads in the first area; and a third bonding wire, wherein one end thereof is formed on the one of the conductive relay pads in the second area and the other end is formed at the top of the second metal bump, wherein the lengths of the first, second and third bonding wire are approximately the same.
2. A multi-chip package type semiconductor device, as claimed in claim 1 , wherein the second semiconductor chip is placed on the center of the first semiconductor chip.
3. A multi-chip package type semiconductor device, as claimed in claim 2 , wherein each of the conductive relay pads is rectangularly-shaped, and is formed on a periphery of the first semiconductor chip and a longer side of the rectangularly-shaped conductive relay pad is parallel to a side of the first semiconductor chip, wherein a distance from the side of the first semiconductor chip to the first area is almost the same as that from the side of the first semiconductor chip to the second area.
4. A multi-chip package type semiconductor device, as claimed in claim 2 , wherein one of the conductive relay relay pads is rectangularly-shaped, and is formed on a periphery of the first semiconductor chip, and a shorter side of the rectangularly-shaped conductive relay pad is parallel to a side of the first semiconductor chip.
5. A multi-chip package type semiconductor device, as claimed in claim 4 , wherein the first area of the rectangularly-shaped conductive relay pad is closer to the side of the first semiconductor chip than the second area.
6. A multi-chip package type semiconductor device, as claimed in claim 2 , wherein the first metal bump is spaced apart from the one end of the third bonding wire, but is electrically connected to the one end of the third bonding wire via the conductive relay pad.
7. A multi-chip package type semiconductor device, comprising: a first semiconductor chip having a plurality of first terminal pads and a plurality of conductive relay pads, each of the conductive relay pads including a first area and a second area, which is different from the first area, wherein each first terminal pad and each conductive relay pad are alternatively aligned; a second semiconductor chip, which is placed on the first semiconductor chip, the second semiconductor chip having a second terminal pad, connected to one of the conductive relay pads in the second area; a plurality of first metal bumps, each of which is formed on one of the conductive relay pads in the first area; a second metal bump formed on the second terminal pad; a first internal terminal connected to one of the first terminal pads; a second internal terminal connected to one of the conductive relay pads in the first area; a first bonding wire, wherein one end thereof is formed on the first internal terminal and the other end is formed on one of the first terminal pads; a second bonding wire, wherein one end thereof is formed on the second internal terminal and the other end is formed at the top of the first metal bump formed on one of the conductive relay pads; and a third bonding wire, wherein one end thereof is formed on the one of the conductively relay pads in the second area and the other end is formed at the top of the second metal bump.
8. A multi-chip package type semiconductor device, as claimed in claim 7 , further comprising an insulating substrate, wherein the first and second internal terminals are formed on the insulating substrate, and the first semiconductor chip is placed on the insulating substrate.
9. A multi-chip package type semiconductor device, comprising: an insulating substrate having a first and second conductive patterns thereon; a first semiconductor chip on the insulating substrate, the first semiconductor chip having a plurality of first internal circuits, a plurality of first terminal pads, each of which is connected to one of the first internal circuits and a plurality of conductive relay pads, each of which is isolated from the first terminal pads, wherein each first terminal pad and each conductive relay pad are alternatively aligned; a second semiconductor chip on the first semiconductor chip, the second semiconductor chip being smaller than the first semiconductor chip, and having a second internal circuit and having a second terminal pad connecting to the second internal circuit; a plurality of first metal bumps, each of which is formed on one of the conductive relay pads; a second metal bump formed on the second terminal pad; a first bonding wire, wherein one end thereof is formed on one of the first terminal pads and the other end is formed on the first conductive pattern; a second bonding wire, wherein one end thereof is formed on the second conductive pattern and the other end is formed at the top of one of the first metal bumps; and a third bonding wire, wherein one end thereof is formed at the top of the one of the first metal bumps and the other end is formed at the top of the second metal bump; wherein the lengths of the first, second and third bonding wire are approximately the same.
10. A multi-chip package type semiconductor device, as claimed in claim 9 , wherein the second semiconductor chip is placed on the center of the first semiconductor chip.
11. A multi-chip package type semiconductor device, comprising: an insulating substrate having a first and second conductive patterns thereon; a first semiconductor chip on the insulating substrate, the first semiconductor chip having a plurality of first internal circuits, a plurality of first terminal pads, each of which is connected to one of the first internal circuits and a plurality of conductive relay pads, each of which is isolated from the first terminal pads, wherein each first terminal pad and each conductive relay pad are alternatively aligned; a semiconductor chip on the first semiconductor chip, the second semiconductor chip being smaller than the first semiconductor chip, and having a second internal circuit and having a second terminal pad connecting to the second internal circuit; a plurality of metal bumps, each of which is formed on one of the conductive relay pads; a first bonding wire, wherein one end thereof is formed on one of the first terminal pads and the other end is formed on the first conductive pattern; a second bonding wire, wherein one end thereof is formed on the second conductive pattern and the other end is formed at the top of one of the metal bumps; and a third bonding wire, wherein one end thereof is formed on the second terminal pad and the other end is formed at the top of the one of the metal bumps; wherein the lengths of the first, second and third bonding wire are approximately the same.
12. A multi-chip package type semiconductor device, as claimed in claim 7 , wherein the first area and the second area are located along a side of the first semiconductor chip.
13. A multi-chip package type semiconductor device, comprising: a first semiconductor chip having a plurality of first conductive portions and a plurality of second conductive portions, each of which has a first area and a second area, which is different from the first area, wherein each first conductive portion and each second conductive portion are alternatively aligned; a second semiconductor chip, which is placed on the first semiconductor chip, the second semiconductor chip having a third consecutive portion, connected to one of the second conductive portion in the first area; a plurality of bumps, each of which is formed on one of second conductive portions in the second area; a first internal terminal connected to one of the first conductive portions; a second internal terminal connected to one of the second conductive portions in the second area; and a wire, wherein one end thereof is formed on the second internal terminal and the other end is formed at the top of the one of the bumps.
14. A multi-chip package type semiconductor device, as claimed in claim 13 , wherein the first area and the second area are located along a side of the first semiconductor chip.
15. A multi-chip package type semiconductor device, as claimed in claim 13 , further comprising an insulating substrate, wherein the first and second internal terminals are formed on the insulating substrate, and the first semiconductor chip is placed on the insulating substrate.
16. A multi-chip package type semiconductor device, as claimed in claim 13 , wherein the first area and the second area are spaced from each other.
17. A multi-chip package type semiconductor device, as claimed in claim 1 , wherein each of the first terminal pads is rectangularly-shaped, and a side of the first terminal pad is parallel to the side of the first semiconductor chip.
18. A multi-chip package type semiconductor device, as claimed in claim 7 , wherein each of the first terminal pads is rectangularly-shaped, and a side of the first terminal pad is parallel to a side of the first semiconductor chip.
19. A multi-chip package type semiconductor device, as claimed in claim 9 , wherein each of the first terminal pads is rectangularly-shaped, and a side of the first terminal pad is parallel to the side of the first semiconductor chip.
20. A multi-chip package type semiconductor device, as claimed in claim 13 , wherein each of the first conductive portions is rectangularly-shaped, and a side of the first conductive portion is parallel to the side of the first semiconductor chip.
21. A multi-chip package type semiconductor device, comprising: an insulating substrate having thereon a first conductive pattern and a second conductive pattern; a first semiconductor chip having a plurality of first internal circuits on the insulating substrate, the first semiconductor chip having a plurality of first terminal pads, each of which is connected to one of the first internal circuits and a plurality of conductive relay pads, each of which is isolated from the first terminal pads, and each of which includes a first area and a second area which is different from the first area, each first terminal pad and each conductive relay pad are alternatively aligned; a second semiconductor chip on the first semiconductor chip, the second semiconductor chip being smaller than the first semiconductor chip, and having a second internal circuit and having a second terminal pad connecting to the second internal circuit; a plurality of metal bumps, each of which is formed on one of the conductive relay pads in the second area; a first bonding wire, wherein one end thereof is formed on one of the first terminal pads and the other end is formed on the first conductive pattern; a second bonding, wherein one end thereof is formed on the second conductive pattern and the other end is formed on one of the conductive relay pads in the first area; and a third bonding wire, wherein one end thereof is formed on the second terminal pad and the other end is formed at the top of the metal bump on the one of the conductive relay pads in the second area; wherein the lengths of the first, second and third bonding wire are approximately the same.
22. A multi-chip package type semiconductor device, as claimed in claim 21 , wherein the second semiconductor chip is placed on the center of the first semiconductor chip.
23. A multi-chip package type semiconductor device, as claimed in claim 22 , wherein each of the conductive relay pads is rectangularly-shaped, and is formed on a periphery of the first semiconductor chip, and a longer side of the rectangularly-shaped conductive relay pad is parallel to a side of the first semiconductor chip, wherein a distance from the side of the first semiconductor chip to the first area is almost the same as that from the side of the first semiconductor chip to the second area.
24. A multi-chip package type semiconductor device, as claimed in claim 22 , wherein each of the conductive relay pads is rectangularly-shaped, and is formed on a periphery of the first semiconductor chip, and a shorter side of the rectangularly-shaped conductive relay pad is parallel to a side of the first semiconductor chip.
25. A multi-chip package type semiconductor device, as claimed in claim 24 , wherein the first area of the rectangularly-shaped conductive relay pad is closer to the side of the first semiconductor chip than the second area.
26. A multi-chip package type semiconductor device, as claimed in claim 22 , wherein each of the metal bumps is spaced apart from the one end of the second bonding wire, but is electrically connected to the one end of the second bonding wire via the conductive relay pad.
