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个人简介
I am Director of the Center for Device Thermography and Reliability (CDTR) at the University of Bristol, Fellow of IEEE, MRS, SPIE, IET and IoP. The CDTR is a researcher center with 20 international researchers, which performs research on semiconductor electronics (RF and power), in particular thermal management, electrical device design & testing and device reliability, and in this context we also develop new testing methodologies. A lot of thrust lies in new materials and new device systems such as GaN, GaN-on-diamond, and Ga2O3 for RF and power applications, ranging from communications, radar, automotive to medical applications. The CDTR collaborates with numerous companies including Element-Six, Huawei, Infineon, MACOM, Northop Grumman, Qorvo, UMS, WIN Semiconductor and others. We also run large UK Engineering and Physical Sciences Research Council (EPSRC) grants e.g. the Programme Grant GaN-DaME and the Platform Grant MANGI, a £7M investment of EPSRC into Bristol led next generation electronics projects. He co-founded TherMap Solutions (https://www.linkedin.com/company/14799659) with two of his postdocs, to spin out key wafer characterization equipment developed as part of his research.
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Journal of Applied Physicsno. 19 (2024)
Daniel Francis, Xiaoyang Ji, Sai Charan Vanjari,Marko Tadjer,Tatyana Feygelson,James Spencer Lundh,Hannah Masten,Joseph Spencer,Alan G. Jacobs, Travis J. Anderson,Karl D. Hobart,Bradford Pate,
ECS Transactionsno. 7 (2024): 15-22
James W. Pomeroy, Alex Leide, Miriam Mowat,Martin Kuball,Mark Davies,Matthew S. L. Jordan,Athanasia Tzelepi, Dave T. Goddard,Dong Liu
JOURNAL OF THE EUROPEAN CERAMIC SOCIETYno. 6 (2024): 3696-3704
Oxide-based Materials and Devices XV (2024)
IEEE TRANSACTIONS ON ELECTRON DEVICESno. 4 (2024): 2367-2372
Filip Gucmann,Milan Tapajna,Kristína Hušeková,Edmund Dobrocka,Alica Rosová,Peter Nádaždy,Peter Eliáš,Fridrich Egyenes, Fedor Hrubišák, Hemendra Chouhan, Javad Keshtkar,Xiang Zheng,
Oxide-based Materials and Devices XV (2024)
ACS applied electronic materialsno. 9 (2023): 5017-5024
2023 53RD EUROPEAN MICROWAVE CONFERENCE, EUMCpp.38-41, (2023)
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