The shape of self-assembled InAs islands grown by molecular beam epitaxy

Journal of Electronic Materials(1999)

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摘要
We have determined the shape of InAs quantum dots using reflection high energy electron diffraction. Our results indicate that self-assembled InAs islands possess a pyramidal shape with 136 bounding facets. This shape is characterized by C 2 v symmetry and a parallelogram base, which is elongated along the [11̅0] direction. Cross-sectional transmission electron microscopy images taken along the [110] and [11̅0] directions as well as atomic force microscopy images strongly support the 136 shape. Furthermore, polarization-resolved photoluminescence spectra show strong in-plane anisotropy, with emission predominantly polarized along the [11̅0] direction, consistent with the proposed quantum dot shape.
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关键词
{136} facets,atomic force microscopy (AFM),cross-section transmission electron microscopy (TEM),InAs quantum dot shape,polarization-resolved photoluminescence (PL),reflection high energy electron diffraction (RHEED)
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