Alignment and nano-connections of isolated carbon nanotubes

M. Sagnes,J.-M. Broto,B. Raquet,T. Ondarçuhu,C. Laurent,E. Flahaut,C. Vieu,F. Carcenac

Microelectronic Engineering（2003）

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摘要

We report a new approach for the alignment and the electrical nano-connection of isolated carbon nanotubes (CNTs). Through a novel combination of proven technics, we have been able to align isolated carbon nanotubes and selectively contact those CNTs by high resolution electron beam lithography (HREBL). Resistance versus temperature (R(T)) experiments have been carried out to determine the reliability of the metal-CNTs interface and to probe the electronic conductance of the CNT.

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关键词

carbon nanotubes,electronic conductance,electronic transport,novel combination,proven technic,electrical nano-connection,new approach,isolated carbon nanotubes,metal-cnts interface,nanofabrication,high resolution electron beam,molecular combing,electron transport,electron beam lithography,carbon nanotube

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