1998 ITC Best Paper: Failure Analysis of Timing and IDDQ-only Failures from the SEMATECH Test Methods Experiment

Phil Nigh, Dave Vallett,Atul Patel, Jason Wright, Franco Motika, Donato Forlenza, Ray Kurtulik, Wendy Chong

ITC '99 Proceedings of the 1999 IEEE International Test Conference（1999）

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摘要

SEMATECH has sponsored a "Test Method Evaluation"study to understand the trade-offs among the most commontest methodologies used in the industry [1,2]. This paper presentsthe results of the failure analysis portion of thatproject. The testing, reliability stressing, characterization,fault diagnosis and physical analysis results are presentedfor 25 devices including "IDDq-only" failures and "delaytest-only" failures.

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关键词

failure analysis portion,physical analysis result,Test Method Evaluation,commontest methodology,fault diagnosis,paper presentsthe result,Failure Analysis,IDDQ-only Failures,SEMATECH Test Methods Experiment

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