A reconfiguration-based defect-tolerant design paradigm for nanotechnologies

Chen He,Margarida F. Jacome,Gustavo de Veciana

Design & Test of Computers, IEEE（2008）

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摘要

This article discusses a novel probabilistic design paradigm targeting reconfigurable architected nanofabrics and points to a promising foundation for comprehensively addressing, at the system level, the density, scalability, and reliability challenges of emerging nanotechnologies. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.

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关键词

probabilistic design,new class,complex probabilistic design space,nanotechnology,defect tolerance,proposed nanofabric architecture,defect-tolerant probabilistic design,reconfiguration-based defect-tolerant design paradigm,reconfigurable architectures,design abstraction,defect-prone nanotechnologies,fault tolerance,current design methodology,logic design,nanotechnologies,reliability challenge,redundancy,reconfigurable architecture,reliability,molecular electronics,reconfigurable fabric region,computing system,new reconfiguration-based defect-tolerant design,proposed design paradigm,defect mapping,logic gates,small functional flow,cost trade-offs,nanofabrics,new design goal,reconfiguration

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