Investigation of Transient Effects on FPGA-based Embedded Systems

In this paper, we present an experimental evaluation of transient effects on an embedded system which uses SRAM-based FPGAs. A total of 7500 transient faults were injected into the target FPGA using Power Supply Disturbances (PSD) and a simple 8-bit microprocessor was implemented on the FPGA as the testbench. The results show that nearly 64 percent of faults cause system failures and about 63 percent of the faults lead to corruption of the configuration data of the FPGA chip.