How to flip a bit?

Michel Agoyan,Jean-Max Dutertre,Amir-Pasha Mirbaha,David Naccache,Anne-Lise Ribotta,Assia Tria

On-Line Testing Symposium（2010）

引用 56|浏览2

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摘要

This note describes laser fault experiments on an 8-bit 0.35μm microcontroller with no countermeasures. We show that reproducible single-bit faults, often considered unfeasible, can be obtained by careful beam-size and shot-instant tuning.

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关键词

careful beam-size,shot-instant tuning,reproducible single-bit fault,laser fault experiment,m microcontroller,cryptography,microcontrollers,microcontroller

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