An effective solution for building memory BIST infrastructure based on fault periodicity

S. Shoukourian,V. Vardanian,Y. Zorian,G. Harutyunyan

VLSI Test Symposium（2013）

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摘要

This paper introduces a new solution for building memory BIST infrastructure, based on rules of fault periodicity and regularity in test algorithms. It is proposed to describe all the periodicity and regularity rules in a form of a special Fault Periodicity Table (FPT) and March Test Template (MTT). FPT allows considering any large number of faults in one table and MTT allows obtaining March tests without using special tools for their generation.

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关键词

effective solution,Test Template,fault periodicity,new solution,large number,regularity rule,test algorithm,memory BIST infrastructure,special tool,special Fault Periodicity Table

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