System Level Radiation Validation Studies for the CMS HCAL Front-End Electronics

msra(2003)

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摘要
Over a 10 year operating period, the CMS Hadron Calorimeter (HCAL) detector will be exposed to radiation fields of approximately 1 kRad of total ionizing dose (TID) and a neutron fluence of 4E11 n/cm2. All front-end electronics must be qualified to survive this radiation environment with no degradation in performance. In addition, digital components in this environment can experience single-event upset (SEU) and single-event latch- up (SEL). A measurement of these single-event effects (SEE) for all components is necessary in order to understand the level that will be encountered. System level studies of the performance of the front-end boards in a 200 MeV proton beam are presented. Limits on the latch-up immunity along with the expected SEU rate for the full front-end system have been measured. The first results from studies of the performance of the two Fermilab custom-designed chips in a radiation environment also are shown.
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关键词
chip,total ionizing dose,front end
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