Localized magnetostrictive magnetization reversal using scanning probe tips

Localized magnetic reversal of a perpendicular anisotropy thin film has been performed using the magnetostrictive response of the film to a force applied by probe tips of scanning force microscope cantilevers. Non-magnetic and magnetic cantilever tips were used to apply local stresses which alter the local magnetization through magnetostriction. The magnetic field of the tip, if any, and the local demagnetizing field of the film reverse the stressed area for stresses exceeding a critical value. These findings were in agreement with a simple model.