Localized states in InxGa1−xN epitaxial film

Solid State Communications(2009)

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摘要
This study investigated localized states from In0.36Ga0.64N epitaxial film grown on a Si (111) substrate by performing macro-photoluminescence, micro-photoluminescence and time-resolved micro-photoluminescence experiments. Experimental data revealed two localized states — single and extended. The single localized state is a single-quantum-dot-like deep confined energy state, which is responsible for the bright line emissions. The extended localized state is a shallow confined energy state, which is related to a broad background emission. This work suggests that the origin of single and extended localized states is the indium-rich InxGa1−xN cluster and the spatial indium concentration fluctuation, respectively.
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78.55.Cr,78.66.Fd
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