Cross-Layer Error Resilience For Robust Systems

ICCAD '10: The International Conference on Computer-Aided Design San Jose California November, 2010(2010)

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摘要
A large class of robust electronic systems of the future must be designed to perform correctly despite hardware failures. In contrast, today's mainstream systems typically assume error-free hardware. Classical fault-tolerant computing techniques are too expensive for this purpose. This paper presents an overview of new techniques that can enable a sea change in the design of cost-effective robust systems. These techniques utilize globally-optimized cross-layer approaches, i.e., across device, circuit, architecture, runtime, and application layers, to overcome hardware failures.
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关键词
CASP,circuit failure prediction,error resilient system architecture,ERSA,LEAP,on-line self-test,diagnostics,reliability,robust system design,soft error
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