A Study of an AIEM Model for Bistatic Scattering From Randomly Rough Surfaces
IEEE T. Geoscience and Remote Sensing（2008）
摘要
In this paper, we study the bistatic scattering using an advanced integral equation model (AIEM). By keeping all the surface current terms in the Kirchhoff surface fields, the bistatic scattering coefficients are obtained. For simplification, the complete Kirchhoff field did not cast into the derivation of the complementary field. We compare varied updated versions of IEM-based models with the small perturbation model, geometrical optics model, and Kirchhoff approximation standard models at respective regions of validity. The results indicate that the new AIEM provides much more accurate predictions for bistatic scattering.
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关键词
remote sensing,geometrical optics model (gom),rough surface,iem-based models,kirchhoff surface field,random processes,integral equation model (iem),perturbation techniques,kirchhoff approximation (ka),geometrical optics model,advanced integral equation model,small perturbation model,small perturbation model (spm),randomly rough surfaces,bistatic scattering,kirchhoff approximation standard model,surface current term,aiem model,geometrical optics,rough surfaces,integral equations,geometric optics,standard model,predictive models,fresnel reflection,surface roughness,surface current,optical scattering,solid modeling
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