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Measuring elastoplastic properties of thin films on an elastic substrate using sharp indentation

Acta Materialia, no. 18 (2007): 6260-6274

Cited by: 83|Views2

Abstract

Nanoindentation is a technique commonly used for measuring material elastoplastic properties. In this study, we extend the indentation analysis to an elastoplastic thin film on an elastic substrate. With the assistance of the substrate effect, the film elastic modulus, yield stress and work hardening exponent can be measured from one simp...More

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