Statistical electro-thermal analysis with high compatibility of leakage power models.

In this work, a statistical electro-thermal analyzer with high compatibility of power model is developed. The developed analyzer takes both the easily implementing advantage of Monte Carlo method and the fast convergent advantage of stochastic analysis method to effectively solve the statistical electro-thermal problem. Experimental results indicate that the developed electro-thermal analyzer can be orders of magnitude faster than the Monte Carlo method under the same accuracy level. The computational time is only 1.16 seconds for a design with over one million gates, and the maximum errors are only 0.34% and 1.84%, compared with the Monte Carlo method, for estimating the mean and the standard deviation profiles of full-chip temperature distribution, respectively.