Resistive Coupling Efficiency Criterion for Evaluating Substrate Shielding Structures of Transformers

Jinglin Shi,Yong Zhong Xiong,James Brinkhoff,Ammar Issaoun,Fujiang Lin

IEEE Electron Device Letters（2008）

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摘要

This letter presents a new way to evaluate the transformer substrate effect by computing its resistive coupling efficiency coefficient etaKr. To assess etaKr, a set of transformers with and without shielding structures was fabricated using standard 0.18-mum CMOS process. The resistive coupling factor etaKr and efficiency etaKr were extracted. It was found that substrate and shielding effects are b...

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关键词

Transformers,Substrates,Mutual coupling,Scattering parameters,Coupling circuits,Frequency,Silicon,Coils,Radiofrequency integrated circuits,CMOS process

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