An in-situ temperature-sensing interface based on a SAR ADC in 45nm LP digital CMOS for the frequency-temperature compensation of crystal oscillators

ISSCC(2010)

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摘要
A crystal-temperature-sensing interface based on an in-situ thermistor and a 1 V 12b digitally calibrated SAR ADC in 45 nm LP CMOS is presented. The digitized temperature readings are used by an LUT-based compensation scheme to stabilize the frequency of a crystal oscillator through digital capacitive load tuning to achieve ±0.5 ppm stability over a -10-to-80°C temperature range.
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关键词
thermistor,crystal oscillators,temperature sensors,thermistors,size 45 nm,analogue-digital conversion,crystal-temperature-sensing interface,digitized temperature readings,temperature -10 c to 80 c,frequency-temperature compensation,voltage 1 v,sar adc,cmos digital integrated circuits,digital cmos,digital capacitive load tuning,complementary metal-oxide-semiconductor,temperature measurement,capacitors,oscillations,calibration,crystals,complementary metal oxide semiconductor
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