Microtrack Profiling Technique For Narrow Track Tape Heads

Microtrack properties of magnetoresistive (MR) tape heads are difficult to measure with conventional microtrack profiling techniques. We present a technique for rapid and dynamic measurement of these profiles for tape heads as narrow as 5-mu-m using a 5-mu-m wide write head translated on a sinusoidal trajectory. This technique can be used to determine the character and stability of the domain microstructure of the sensor.