CMOS Active Pixel Sensor Technology and Reliability Characterization Met h odol og y

Yuan Chen,Steven M. Guertin,Bedabrata Pain,Sammy Kayaii

msra（2008）

引用 23|浏览7

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摘要

This paper describes the technology, design features and reliability characterization methodology of a CMOS Active Pixel Sensor. Both overall chip reliability and pixel reliability are projected for the imagers.

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关键词

pixel reliability.,imaging sensor reliability,cmos active pixel sensors,reliability analysis,reliability,cmos,pixels

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