On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP)
Microelectronics Reliability(2011)
摘要
We present a new method for the on-wafer-characterisation for the reverse recovery behaviour of integrated diodes, which can perform on-wafer automated measurements over a wide range of different bias and pulsing conditions.
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关键词
diodes,on-wafer,reverse-recovery,transmission-line-pulsing
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