Layout Dependence Modeling for 45-nm CMOS With Stress-Enhanced Technique

Layout dependences for stress-enhanced MOSFETs including contact positioning, the second neighboring poly effect, and bent diffusion are modeled in 45-nm CMOS logic technology. It is found that the sensitivity of contact position in the channel direction is larger for PMOS with a higher stress liner than for NMOS. The effect of contact positions is modeled by using the distance of contact to gate ...