Assessment of neutron- and proton-induced nuclear interaction and ionization models in Geant4 for Simulating single event effects

IEEE Transactions on Nuclear Science(2004)

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摘要
This paper examines the performance of the Geant4 radiation transport toolkit for the simulation of energy deposition from proton- and neutron-nuclear interactions in silicon microelectronics. The results show that for large (/spl sim/300 /spl mu/m) to small (/spl sim/0.5 /spl mu/m) feature-size devices, the nucleon-nuclear and electromagnetic interaction models within the toolkit provide energy d...
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关键词
Ionization,Discrete event simulation,Object oriented modeling,Physics,Neutrons,Microelectronics,Ionizing radiation,Silicon,Protons,Testing
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