Assessment of neutron- and proton-induced nuclear interaction and ionization models in Geant4 for Simulating single event effects
IEEE Transactions on Nuclear Science(2004)
摘要
This paper examines the performance of the Geant4 radiation transport toolkit for the simulation of energy deposition from proton- and neutron-nuclear interactions in silicon microelectronics. The results show that for large (/spl sim/300 /spl mu/m) to small (/spl sim/0.5 /spl mu/m) feature-size devices, the nucleon-nuclear and electromagnetic interaction models within the toolkit provide energy d...
更多查看译文
关键词
Ionization,Discrete event simulation,Object oriented modeling,Physics,Neutrons,Microelectronics,Ionizing radiation,Silicon,Protons,Testing
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要