P-228: Degradation of White Light Emitting OLEDs

JungBae Song,Sunghun Lee,Mu-Gyeom Kim,Sang-Yeol Kim,Young-Mok Son,Woo Sung Jeon,Jeongyeon Won,Inyong Song,Hyouk Soo Han,Dai Kyu Kim,JaeGwan Chung,SungKee Kang,Shinichiro Tamura,JongMin Kim,JunHo Choi,JaeKook Ha,SungSoo Lee,ChangWoong Chu

SID INTERNATIONAL SYMPOSIUM DIGEST OF TECHNICAL PAPERS（2008）

引用 1|浏览54

暂无评分

摘要

We firstly report the degradation analysis of multilayer structured WOLED by using spectroscopic and microscopic analytical methods. Our analytical results demonstrated that the interface between cathode and electron-transporting layer is responsible for the intrinsic long-term degradation of WOLEDs.

查看译文

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要