A High-Resolution Electron Microscopy Study Of Mgxzn1-Xo Grown On Mgo/C-Sapphire

PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 3, NO 4(2006)

引用 4|浏览2
暂无评分
摘要
We report on the microstructure of MgxZn1-xO films grown on MgO/c-sapphire by P-MBE. Cross sectional specimens of three layers with rock salt, wurtzite, and mixed crystal structure were studied by high-resolution transmission electron microscopy (HRTEM). Selected area diffraction pattern (SADP) and fast fourier transform (FFT) were also employed to analyze the samples. The results indicate the growth of cubic-MgZnO along the [111] direction accompanied by twinning. HRTEM micrograph of wurtzite-MgZnO confirmed that initial stage of the growth starts with a cubic structure and then changes to the wurtzite phase. Our results demonstrate that by introducing a thin MgO buffer layer, growth of cubic-MgZnO with low Mg content is feasible. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
更多
查看译文
关键词
cross section,high resolution transmission electron microscopy,microstructures,crystal structure,fast fourier transform
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要