LCTI–SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing

Yuta Yamato,Kohei Miyase,Seiji Kajihara,Xiaoqing Wen,Laung-Terng Wang,Michael A. Kochte

IEEE Design & Test（2013）

引用 8|浏览9

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摘要

In this contribution, the authors describe a method for ensuring that false failures do not occur when shifting scan chains for testing. Their approach identifies an optimal combination of scan segments for simultaneous clocking that reduces the switching activity near clock trees while maintaining the average power reduction for conventional scan segmentation. Experiments using various benchmark circuits demonstrate the overall utility of their approach.

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关键词

simultaneous clocking,benchmark circuits,clock trees,timing circuits,clock tree,shift power reduction,switching activity,scan testing,lcti ss,shifting scan chains,optimal combination,clocks,avoiding shift timing failures,scan segments,low clock tree impact scan segmentation,scan segmentation,clock skew,average power reduction

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