Mapping high-pressure Bridgman Cd/sub 0.8/Zn/sub 0.2/Te

M. Schieber,Haim Hermon, R. B. James,J. Lund,A J Antolak, David Michael Morse,N. N. Kolesnikov,Yu. N. Ivanov, M. s. Goors,J. M. Van Scyoc,Hyunsoo Yoon,J E Toney,T. E. Schlesinger,F. P. Doty, J. P. D. Cozzatti

IEEE Transactions on Nuclear Science（1997）

引用 18|浏览11

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摘要

Single crystals of Cd/sub 0.8/Zn/sub 0.2/Te grown at the Institute of Solid State Physics, Chernogolovka, Russia, by the high-pressure vertical Bridgman method (HPVB) were mapped using X-ray fluorescence (XRF), X-ray diffraction (XRD), photoluminescence (PL), and leakage current measurements, most of the Russian samples which we refer to as p-type CZT were more uniform in Zn composition than U.S. ...

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关键词

Crystalline materials,Zinc,Crystals,Tellurium,Solid state circuits,Physics,Fluorescence,X-ray diffraction,X-ray scattering,Photoluminescence

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