Growth and optical properties of p-sexiphenyl thin films
Synthetic Metals(2003)
摘要
Thin films of p-sexiphenyl were grown by organic molecular beam deposition on fused silica. The influence of the growth conditions on the film structure and morphology was studied by AFM and absorption measurements. Intermolecular interactions determine the electronic structure in the crystalline environment. The optical properties of thin films can thus be varied by the choice of the growth conditions.
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关键词
polycrystalline thin films,atomic force microscopy,UV-VIS absorption,p-sexiphenyl
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