Degradation Analysis of InP Buried Heterostructure Layers in Lasers Using Optical-Beam-Induced-Current Technique

Tatsuya Takeshita,Tomonari Sato,Manabu Mitsuhara,Yasuhiro Kondo,Hiromi Oohashi

IEEE Transactions on Device and Materials Reliability（2010）

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摘要

The degradation of InP buried heterostructure layers in lasers during constant-power aging is investigated by using the optical-beam-induced-current (OBIC) technique. An increase in OBIC intensity after aging is detected in the InP layer, and it is shown that the carrier concentration around the p-type InP buried layer of the mesa sidewall is decreased by aging. This technique is useful for detect...

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关键词

Degradation,Indium phosphide,Aging,Optical sensors,Monitoring,Distributed feedback devices,Semiconductor lasers,Face detection,Power lasers,Waveguide lasers

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