The Design and Characterization of a Half-Volt 32 nm Dual-Read 6T SRAM.

IEEE Transactions on Circuits and Systems I: Regular Papers(2011)

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摘要
Dual read port 6-transistor (6T) SRAMs play a critical role in high-performance cache designs thanks to doubling of access bandwidth, but stability and sensing challenges typically limit the low-voltage operation. We report a high-performance dual read port 8-way set associative 6T SRAM with a one clock cycle access latency, in a 32 nm metal-gate partially depleted SOI process technology, for low-...
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关键词
Clocks,Random access memory,Arrays,Delay,Latches,Logic gates
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