谷歌浏览器插件
订阅小程序
在清言上使用

Functional and Technological Integration of Measurement Microsystems

IEEE instrumentation & measurement magazine(2004)

引用 10|浏览1
暂无评分
摘要
The field of measurement microsystems has progressed with advances in the fields of microelectronics, micromechanics, microoptics, and digital signal processing (DSP). In this article, the author summarizes a unified conceptual basis for measurement microsystems, discusses some specifics of integration, and describes an innovative approach to the development of a micro-opto-electrical system (MOEM...
更多
查看译文
关键词
Electric variables measurement,Signal processing,Digital signal processing,Instruments,Semiconductor device measurement,Length measurement,Time measurement,Application specific integrated circuits,Microelectronics,Digital signal processing chips
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要