Near-field scanning optical microscopic studies of micro-ring resonators
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting（1999）
摘要
Near-field Scanning Optical Microscopy has been used to measure internal optical modes in channel waveguides and ring resonators. The period of the observed standing modes is a direct measure of the effective index
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关键词
integrated optics,micro-optics,near-field scanning optical microscopy,optical resonators,optical waveguides,channel waveguides,effective index,internal optical modes,micro-ring resonators,near-field scanning optical microscopic studies,standing modes,optical scattering,indexation,near field scanning optical microscope,optical microscopy,near field scanning optical microscopy,optical filters
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