Optical and Electrical Low-Frequency Noise and Their Correlation Measurements in InGaAsP MQW Lasers

J Matukas,S Pralgauskaite,V Palenskis,J Vysniauskas,S Smetona,JG Simmons

13th International Conference on Microwaves, Radar and Wireless Communications MIKON - 2000 Conference Proceedings (IEEE Cat No00EX428)

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摘要

In this study, the experimental investigation results of InGaAsP multi-quantum-well (MQW) ridge-waveguide Fabry-Perot lasers are presented. Comprehensive studies of the optical and electrical low-frequency noise spectral densities have been carried out under wide laser current and temperature range. At defined currents and/or temperatures, the very strongly correlated electrical and optical noise with Lorentzian type spectrum were observed in Fabry-Perot diode operation due to the mode intensity hopping effect

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关键词

III-V semiconductors,gallium compounds,indium compounds,laser noise,noise measurement,quantum well lasers,semiconductor device noise,spectral analysis,waveguide lasers,Fabry-Perot diode operation,InGaAsP,Lorentzian type spectrum,MQW lasers,MQW ridge-waveguide Fabry-Perot lasers,correlation measurements,electrical low-frequency noise,laser current range,mode intensity hopping effect,multi-quantum-well lasers,noise spectral densities,optical low-frequency noise,temperature range

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